storiet v.2

theme

voice

language

sign in
Cover of Advances in scanning probe microscopy

a novel ·

Advances in scanning probe microscopy

by

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic …

start reading + shelf
  • ● 78% match for you

the long version

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

M

Margaret's verdict

"This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), …"

— Margaret

highlights

what readers held onto

No highlights yet. Be the first.

discussion

what readers said

No reviews yet. Finish it; tell us what you found.